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About Company

Zilta – renamed Siniavsky Enterprises LaserTecn team  whose scientific jobs have been begun from 1982 in Vilnius Science-Research Institute of Radiomeasuring Instruments. Siniavsky’s team had made several successful laser-devices of ultrafast optoelectronics and fiber optics before the Soviet Union reformation. The post graduated of the Moscow State University on laser spectroscopy Sinjavsky Nikolaj be in lead all the time. Established in 1993, as a spin-off from Vilnius Science-Research Institute of Radiomeasuring Instruments, Siniavsky’s team work in USA-Lithuania Co Aitisa till 1996 –when Siniavsky Enterprises was founded separatly. From this date we had opened additional business - to supply science and laser optics, crystals, equipment and laser systems. All time we closely cooperated with many centers of science, manufacturers of unique optics and technologies. More than 15 year we are providing the Science and Laser Optics market successfully.

Zilta strength is built on profound knowledge accumulated by its people in general and its leader Nikolaj Siniavskij in particular. Our abilities based over 35 year experience in laser physics, spectroscopy, laser and optical design, exceptionally detailed R & D of fast optoelectronics, science and laser measured systems. We welcome you to view our site to learn more about our complete solutions including. Thank you for visiting ZILTA.

Commercial offer

          Shape: Plane. Spherical-Cylindrical-Toroidal.   Ellipsoidal, Parabolic, Hyperbolic & Free Form.

         Micro-Roughness(rms):<2nm (conventional polishing); <0.1nm (Magnetorheological finishing).

         Computer controlled fine-correction polishing; Smart Ion Beam Figuring: look here

 Substrate material: AstroSitall® & Zerodur; Fused Silica; other on request.

  COATING:  High Reflection (HR) with Ion Beam Assistance from XUV to THz wavelength region (from 0.5 nm to 5 mm):

                    Standard EUV (Cr_binder +Au (Pt) 50nm): unprotected HR @ (15÷170) nm & (Vis-IR) at normal and grazing incidence;

                    Special “EUV” (Cr_binder + metal Ingredients): unprotected HR @ (4÷90) nm at grazing incidence;

                    Special “XUV”: HR@(1÷50) nm at grazing incidence;   Special “THz”@(0.6-1000 µm) at normal and grazing incidence.

                    Special “Laser”: dielectric or metal protected HR (with high induced damage threshold);

Specification

Enhanced

Standard

Minimal standard

Control method and Notes

Dimensions     [mm]

“Synchrotron mirrors”

“Astro & Space mirrors”

Up to 500

Up to 1500

 

150 – 250

300 - 500

 

 

90 – 110

200 - 250

 

Customer’s drawing preferably

Unique diamond calibers certificated at Institute of Standards.

Direct optical measurements: ±0.01% @ (0.1-30) m

Clear aperture (CA)

Up to 100 %

90 %

-

Tolerances of RoC

(Radius of Curvature)

0.01%

0.4 %

1 %

Roughness, RMS [nm]

“Synchrotron mirrors”

“Astro & Space mirrors”

 

~ 0.1

~ 0.1

 

~ 1

~ 10

 

-

Micromap measurements 0.05 nm @ (1-400) um;

3D Optical Profiler " TalySurf CCI " Zygo Co *)

Slope error (RMS)

0.08 arcSec

2-20 arcSec

-

"VeryFire (AMETEK)" Zygo Co”. with objective ø 500 mm

2D-map topography of “Height Error” of the CA mirror by

Lateral shift Interferometric Inspection scheme **)

The quality of the focal image by "Focal Spot Dia

Shape accuracy, RMS

(at test λ=632nm)

  λ /300 (flat, spherical)

  λ /150 (OAP, elliptical)

  λ /100 (free form)

λ /50 - λ /60

λ /40 (Flat, Spherical)

 - 

λ /30 (Aspherical)

OAP: Off Axis Angle

179° 

(grazing incidence)

0° -30°

35° -160°

not considered

No quote of OAP made on Diamond Turning Technology

 

       *) The TalySurf CCI is an advanced 3-dimensional non-contact optical metrology tool used for advanced surface characterization. These instruments have the ability to offer a true  topo-graphical  representation of a Roughness with 0.01 nm Z-resolution over a full scan range, with over 1,000,000 data points www.taylor-hobson.com/non-contact-profilers.html

        **) 2D Micromap measured by Special 3D Optical Profiler System based on Lateral shift Interferometric Inspection scheme with best resolution of “Height Error”: ±2 nm (see below) and model "VeryFire (AMETEK)" ("Zygo Co.") as reference device: https://www.zygo.com/?/met/interferometer

 

 
 
 

Z I L T A Co. unlimited © 2019, Lithuania European Union, Fax: +370 7000 4444, E-mail: zilta[eta]lasertechn.com

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